BRITISH STANDARD

Fibre optic
interconnecting
devices and passive
components — Basic
test and measurement
procedures —
Part 3-16: Examinations and
measurements — Endface radius of
spherically polished ferrules

The European Standard EN 61300-3-16:2003 has the status of a
British Standard

ICS 33.180.20

12&23<,1*:,7+287%6,3(50,66,21(;&(37$63(50,77('%<&23<5,*+7/$:

BS EN
61300-3-16:
2003


BS EN 61300-3-16:2003

National foreword
This British Standard is the official English language version of
EN 61300-3-16:2003. It is identical with IEC 61300-3-16:2003. It supersedes
BS EN 61300-3-16:1997 which is withdrawn.
The UK participation in its preparation was entrusted by Technical Committee

GEL/86, Fibre optics, to Subcommittee GEL/86/2, Fibre optic interconnecting
devices and passive components, which has the responsibility to:

—

aid enquirers to understand the text;

—

present to the responsible international/European committee any
enquiries on the interpretation, or proposals for change, and keep the
UK interests informed;

—

monitor related international and European developments and
promulgate them in the UK.

A list of organizations represented on this subcommittee can be obtained on
request to its secretary.
Cross-references
The British Standards which implement international or European
publications referred to in this document may be found in the BSI Catalogue
under the section entitled “International Standards Correspondence Index”, or
by using the “Search” facility of the BSI Electronic Catalogue or of British
Standards Online.
This publication does not purport to include all the necessary provisions of a
contract. Users are responsible for its correct application.
Compliance with a British Standard does not of itself confer immunity
from legal obligations.


This British Standard was
published under the authority
of the Standards Policy and
Strategy Committee on
7 March 2003

Summary of pages
This document comprises a front cover, an inside front cover, the EN title page,
pages 2 to 14, an inside back cover and a back cover.
The BSI copyright date displayed in this document indicates when the
document was last issued.

Amendments issued since publication
Amd. No.
© BSI 7 March 2003

ISBN 0 580 41363 2

Date

Comments


EN 61300-3-16

EUROPEAN STANDARD
NORME EUROPÉENNE
EUROPÄISCHE NORM


January 2003

ICS 33.180.20

Supersedes EN 61300-3-16:1997

English version

Fibre optic interconnecting devices and passive components Basic test and measurement procedures
Part 3-16: Examinations and measurements Endface radius of spherically polished ferrules
(IEC 61300-3-16:2003)
Dispositifs d'interconnexion
et composants passifs à fibres optiques Méthodes fondamentales d'essais
et de mesures
Partie 3-16: Examens et mesures Rayon de la face terminale
des embouts polis sphériquement
(CEI 61300-3-16:2003)

Lichtwellenleiter-Verbindungselemente
und passive Bauteile Grundlegende Prüf- und Messverfahren
Teil 3-16: Untersuchungen
und Messungen Endflächenradius sphärisch polierter Stifte
(IEC 61300-3-16:2003)

This European Standard was approved by CENELEC on 2002-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other

language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61300-3-16:2003 E


Page 2

EN 61300−3−16:2003

Foreword
The text of document 86B/1746/FDIS, future edition 2 of IEC 61300-3-16, prepared by SC 86B, Fibre
optic interconnecting devices and passive components, of IEC TC 86, Fibre optics, was submitted to
the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61300-3-16 on 2002-12-01.
This European Standard supersedes EN 61300-3-16:1997.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
– latest date by which the national standards conflicting
with the EN have to be withdrawn

__________

(dop)

2003-10-01

(dow)

2005-12-01

Endorsement notice
The text of the International Standard IEC 61300-3-16:2003 was approved by CENELEC as a European
Standard without any modification.
__________


Page 3

EN 61300−3−16:2003
163-00-316 Ó CEI:0230(E)

–3–

CONTENTS

1

Scope ...............................................................................................................................4

2


Normative reference .........................................................................................................4

3

General description ..........................................................................................................4

4

Apparatus .........................................................................................................................5

5

4.1 Method 1 – Two-dimensional surface analysis .........................................................5
4.2 Method 2 – Two-dimensional surface analysis by interferometry system..................6
4.3 Method 3 – Three-dimensional surface analysis by interferometry system ...............7
Procedure.........................................................................................................................9

6

5.1 Measurement region................................................................................................9
5.2 Method 1 – Two-dimensional surface analysis ....................................................... 10
5.3 Method 2 – Two-dimensional surface analysis by interferometry system................ 12
5.4 Method 3 – Three dimensional surface analysis by interferometry system ............. 13
Details to be specified .................................................................................................... 13
6.1
6.2
6.3

Method 1 – Two-dimensional surface analysis ....................................................... 13

Method 2 – Two-dimensional surface analysis by interferometry system................ 13
Method 3 – Three-dimensional surface analysis by interferometry system ............. 14

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ


Page 4

EN 61300−3−16:2003
–4–

613-00-316 Ó CEI:0230(E)

FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-16: Examinations and measurements –
Endface radius of spherically polished ferrules

1

Scope

This part of IEC 61300 describes a procedure to measure the endface radius of a spherically
polished ferrule and angled ferrule or an angled spherically polished ferrule.

2

Normative reference


The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
None.

3

General description

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

The ferrule endface radius R is defined as the radius of curvature of the portion of the endface
which is domed for physical contact. It is assumed that the endface is spherical, although in
practice the endface is often aspherical (see figure 1).

R

IEC 2657/02

Figure 1 – Radius of curvature of the endface

Three methods are described in this standard for measuring the radius of curvature:
a)

method 1:

analyzing the endface with a two-dimensional surface analyzer;

b)


method 2:

analyzing the endface with a two-dimensional interferometry type surface
analyzer;

c)

method 3:

analyzing the endface with a three dimensional interferometry type surface
analyzer.

(Method 3 is a reference method.)


Page 5

EN 61300−3−16:2003
163-00-316 Ó CEI:0230(E)

4

–5–

Apparatus

4.1

Method 1 – Two-dimensional surface analysis


The apparatus shown in figure 2 consists of a suitable ferrule holder, a positioning stage and
a two-dimensional surface analyzer.
4.1.1

Ferrule holder

This is a suitable device to hold the ferrule in a fixed vertical position, or tilted in the case of
an angled ferrule type.
4.1.2

Positioning stage

The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved
to the appropriate position. The stage shall have sufficient rigidity to allow the ferrule endface
to be measured accurately.
Two dimensional surface analyzer

Moving from left to right
Probe

Profilometer

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

Ferrule endface
Ferrule holder

Ferrule

Profile data

processing unit

Moving from
front to rear

Monitor

Positioning stage

IEC 2658/02

Figure 2 – Apparatus for two-dimensional surface analysis
4.1.3

Two-dimensional surface analyzer

The two-dimensional surface analyzer shall have an ability to measure the radius of curvature
with an accuracy better than ±0,1 mm. The analyzer shall consist of a profilometer, a profile
data processing unit and a monitor.
The profilometer shall be equipped with a wedge-shaped type probe. The motion of the probe
shall be perpendicular to the ferrule axis.


Page 6

EN 61300−3−16:2003
–6–

613-00-316 Ó CEI:0230(E)


The profile data processing unit shall be able to process the profile data so as to measure the
radius of curvature: the unit calculates an ideal circle fitted to the spherical ferrule endface
from the measured profile data, and calculates a converted data from the measured profile
data by extracting the ideal circle data.
The monitor shall display the measured and the calculated profiles.
4.2

Method 2 – Two-dimensional surface analysis by interferometry system

An apparatus is shown in figure 3. The apparatus consists of a suitable ferrule holder, a
positioning stage and a two-dimensional interferometry analyzer.
4.2.1

Ferrule holder

This is a suitable device to hold the ferrule in a fixed vertical position (or tilted in the case of
an angled ferrule type).
4.2.2

Positioning stage

The ferrule holder is fixed to the positioning stage, which shall be able to move the holder to
the appropriate position. The stage shall have sufficient rigidity to allow the ferrule endface
to be measured accurately.
4.2.3

Two-dimensional interferometry analyzer

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ


The two-dimensional interferometry analyzer shall have the ability to measure the radius of
curvature with an accuracy better than ±0,1 mm. The analyzer shall consist of a microscope
unit with a monochromatic light source, an image data processing unit and a monitor.
The microscope unit shall consist of an interference microscope equipped with a video
camera to send the interference image of the ferrule surface to the video board of the image
data processing unit.

The image data processing unit shall be able to process a row (or a group of adjacent rows to
cover a narrow stripe) of the video image passing across a fibre diameter. The unit calculates
the characteristic parameters (frequency and phase) of the interference light intensity curve of
the analyzed row by fitting the acquired data with a theoretical function. The radius of
curvature is evaluated from the phase shift of the interference fringes in the ferrule zone. The
system must be able to recognize the 2p phase shifts.
The monitor shall display the light intensity curve, the fitting functions and the measurement
results.


Page 7

EN 61300−3−16:2003
163-00-316 Ó CEI:0230(E)

–7–

Two-dimensional interferometry analyzer

Microscope unit
Interference
microscope
Image data

processing unit
with video board

Objective
Monitor
Ferrule endface
Ferrule holder

Ferrule

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ
Positioning stage

IEC 2659/02

Figure 3 – Apparatus for two-dimensional surface analysis by interferometry system
4.3

Method 3 – Three-dimensional surface analysis by interferometry system

The apparatus shown in figure 4 consists of a suitable ferrule holder, a positioning stage and
a three-dimensional interferometry analyzer.


Page 8

EN 61300−3−16:2003
–8–

613-00-316 Ó CEI:0230(E)


Three-dimensional interferometry analyzer

Microscope unit
Interference
microscope
Surface data
processing unit
Actuator
Objective
Monitor
Ferrule endface
Ferrule holder

Ferrule

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ
Positioning stage

IEC 2660/02

Figure 4 – Apparatus for three-dimensional surface analysis by interferometry system
4.3.1

Ferrule holder

This is a suitable device to hold the ferrule in a fixed vertical position, or tilted in the case of
an angled ferrule type.
4.3.2


Positioning stage

The ferrule holder is fixed to the positioning stage, which shall be able to move the holder to
the appropriate position. The stage shall have enough rigidity so as to measure the ferrule
endface.
4.3.3

Three-dimensional interferometry analyzer

The three-dimensional interferometry analyzer shall have an ability to measure the radius of
curvature with an accuracy better than ±0,1 mm. The analyzer shall consist of a microscope
unit, a surface data processing unit and a monitor.


Page 9

EN 61300−3−16:2003
163-00-316 Ó CEI:0230(E)

–9–

The microscope unit shall consist of an interference microscope, an actuator and an image
scanner. The interference microscope equipped with an objective is arranged so that its
motion is parallel to the axis of the ferrule. The actuator transports the objective vertically.
The image scanner converts interference image signals to position data.
The surface data processing unit shall be able to process the position data so as to measure
the radius of curvature: the unit calculates an ideal spherical surface fitted to the spherical
ferrule endface from the measured surface data and calculates a converted surface data from
the measured surface data by extracting the ideal spherical surface data.
The monitor shall display the measured and the calculated three dimensional surface profiles.


5
5.1

Procedure
Measurement region

Two regions shall be defined on the ferrule endface for the measurement (see figure 5).
a) Fitting region: the fitting region is set on the ferrule surface, and defined by a circular
region having a diameter D minus the diameter E of the extracting region. The fitting
region shall be defined in order to cover the contact zone of the ferrule endface when the
ferrule is mated;
b) Extracting region: the extracting region, which includes the fibre endface region and the
adhesive region, is defined by a circle having a diameter E;

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

The two regions shall be centred on the ferrule axis. For connectors with 125 µm nominal
fibre diameter and a curvature radius of spherically polished ferrule endface of about 5 mm
to 25 mm the values of the diameters D and E are as follows:
D = 250 µm;
E = 140 µm;


Page 10

EN 61300−3−16:2003
613-00-316 Ĩ CEI:0230(E)

1 –0 –


ỈD
ỈE

Fitting region

Fibre endface

Extracting region

Ferrule
Fibre endface

Ferrule endface

Ferrule

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

Fibre

Adhesive

IEC 2661/02

Figure 5 – Ferrule endface and measurement regions

5.2

Method 1 – Two-dimensional surface analysis


5.2.1 Affix the ferrule in the ferrule holder so that the portion of the ferrule closest to the
endface is held with the holder. The length of the ferrule contacting the holder shall be at
least twice the diameter of the ferrule.
5.2.2 Adjust the chisel tip of the profilometer so that the bottom edge of the tip is
perpendicular to the axis of the ferrule.
5.2.3 Adjust the ferrule holder so that the profilometer trace passes through the axis of the
ferrule.
5.2.4 Cause the profilometer to trace across the surface of the endface, recording the profile
data on the profile data processing unit.
5.2.5

Take the profile data of the fitting region from the measured profile data.

5.2.6

The radius R is evaluated by fitting a circle arc to the fitting region.


Page 11

EN 61300−3−16:2003
163-00-316 Ĩ CEI:0230(E)

– 11 –

ỈD
ỈE

A


B

F

C

G

R1

R2

IEC 2662/02

Figure 6 – Measurements for calculating the radius of curvature with method 1
A suggest procedure for this evaluation is to use the following relationship (see figure 6):

R =

where

AC + BC
R1 + R2
=
2
4

ỉ 1
1

× çç
+
b2
è b1

ư
÷÷
ø

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

AC = CG and BC = CF

and

b1 =

b2 =

x × y AB - x AB × y AB
x2

2

- x AB
AB

x × y FG - x FG × y FG
x2


2

- x FG
FG

where
the

brackets give the average of the included variable(s) over the interval identified by the
associated subscript;

x

is the absolute value of the distance from the point C;

y

is the corresponding ordinate value;

b 1 and b 2 are the absolute values of slopes of the straight line segments approximating the
profile in the AB and FG zones using the linear square fit.


Page 12

EN 61300−3−16:2003
1 –2 –

5.3


613-00-316 Ó CEI:0230(E)

Method 2 – Two-dimensional surface analysis by interferometry system

5.3.1 Affix the ferrule in the holder so that the portion of the ferrule closest to the endface is
held with the holder. The length of the ferrule contacting the holder shall be at least twice the
diameter of the ferrule.
5.3.2 Adjust the holder position so that the image of the ferrule endface in the fibre zone is
seen on the monitor.
5.3.3 Adjust the interferometry device so that the interference fringes appear on the endface
ferrule surface.
5.3.4 Adjust the interferometry device so that the interference fringes are perpendicular to
the ferrule endface that shall be analyzed.
5.3.5 Measure the diameter of two rings designated as m and m+p, where ring m+p is larger
than ring m. Choose the m and m+p diameters to cover the fitting area. Calculate the radius
of curvature R (see figure 7) according to the following formula:
R = (D m+p 2 – D m 2 ) / 4pλ
where
R

is the calculated radius of curvature;

D m+p

is the diameter of the m+p ring;

Dm

is the diameter of the m ring


NOTE

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

Any two rings can be used to make the measurement.

For additional confidence, measure the diameter of three or more rings and calculate an
average radius based on all the possible combinations of two ring diameters.


Page 13

EN 61300−3−16:2003
163-00-316 Ó CEI:0230(E)

– 31 –

Ring
m
Ring
Ring m + 1
Ring m + 2
Display

IEC 2663/02

Figure 7 – Measurements for calculating the radius of curvature
5.4

Method 3 – Three dimensional surface analysis by interferometry system


5.4.1 Affix the ferrule in the ferrule holder so that the portion of the ferrule closest to the
endface is held with the holder. The length of the ferrule contacting the holder shall be at
least twice the diameter of the ferrule.
5.4.2 Adjust the transportation direction of the microscope unit so that it is parallel to the
ferrule axis, and position the holder so that the axis of the interference microscope coincides
with the ferrule axis.
5.4.3 Adjust the microscope so that the distance between the microscope and the ferrule
endface comes within its working distance.

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ

5.4.4 Measure the surface of the endface with the three dimensional surface analyzer,
recording the three dimensional surface measurement data on its surface data processing
unit.

5.4.5 Take the fitting region of the surface data from the measured surface data, and
calculate an ideal spherical surface so as to fit to the fitting region.

6

Details to be specified

The following details, as applicable, shall be specified in the detail specification:
6.1

Method 1 – Two-dimensional surface analysis

–


Type of stylus

–

Filtering

–

Nominal angle of tilt if a ferrule holder for angled endface connectors

–

Any deviation from this method

6.2

Method 2 – Two-dimensional surface analysis by interferometry system

–

Microscope magnification

–

Filtering

–

Nominal angle of tilt if a ferrule holder for angled endface connectors


–

Any deviation from this method


Page 14

EN 61300−3−16:2003
1 –4 –

6.3

613-00-316 Ó CEI:0230(E)

Method 3 – Three-dimensional surface analysis by interferometry system

–

Microscope magnification

–

Filtering

–

Nominal angle of tilt if a ferrule holder for angled endface connectors

–


Any deviation from this method

___________

ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ


ｗｗｗ．ｂｚｆｘｗ．ｃｏｍ


BS EN
61300-3-16:
2003

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